Category of Study: Analog/RF Integrated Circuits

Office: Room 253, Essex Hall

Email:  rashidza@uwindsor.ca

Telephone: (519) 253-3000 extension 3931

Fax:  (519) 971-3695

Personal Homepage

Fields of Interest:
Mixed-Signal Testing, Radio Frequency Identification (RFID), Integrated Wireless Communication Systems.

Biography:
Rashid Rashidzadeh received the B.S.E.E. degree from Sharif University of Technology, Tehran, Iran, in 1989 and the M.A.Sc. and Ph.D. degrees in electrical engineering from University of Windsor, Windsor, ON, Canada in 2003 and 2007 respectively. From 1990-2000 he worked in industry where he was involved with the design and test of analog and RF circuits for telecommunication systems. He is currently with the Electrical and Computer Engineering Department at the University of Windsor. His research focuses on design and test of analog/RF cores in mixed-signal system-on-chip environments.
 

Selected Publications

N. Chang, R. Rashidzadeh, M. Ahmadi, “Robust indoor positioning using differential Wi-Fi access points,” IEEE Trans. Consumer Electronics, vol. 56, no. 3, pp. 105-113, Aug. 2010.

R. Rashidzadeh, M. Ahmadi and W. C. Miller, “An all-digital self-calibration method for a vernier based time-to-digital converters,” IEEE Trans. Instrumentation and Measurement, vol. 59, pp. 463 – 469, Feb., 2010.

R. Rashidzadeh, R. Muscedere, M. Ahmadi and W. C. Miller, “A delay generation technique for narrow time interval measurement,” IEEE Trans. Instrumentation and Measurement, Vol. 57, No. 7, pp. 2245-2252, Jul. 2009.

R. Rashidzadeh, M.Ahmadi, W. C. Miller, “ Test and measurement of analog and RF cores in mixed-signal SoC environment,” IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 26, no. 10, pp. 1855 – 1865, Oct. 2007.

R. Rashidzadeh, M. Ahmadi, W. C. Miller, “On-chip measurement of waveforms in mixed signal circuits using segmented sampling technique,” Journal of Analog Integrated Circuits and Signal Processing, vol. 50, no. 2, pp. 105-113, Feb. 2007.

I. Basith, N. Kandalaft, R. Rashidzadeh, “Build-in self-test for capacitive MEMS using a charge control technique,” IEEE 19th Asian Test Symposium(ATS2010), Shanghai, China, Dec. 2010, pp. 135-140.

N. Kandalaft, I. Basith, R. Rashidzadeh, “A MEMS based device interface board,” International Test Conference, Austin, Texas, 2010, pp. 1.

M. Azarmehr, R. Rashidzadeh, M. Ahmadi, “High-speed CMOS track-and-hold with an offset cancellation replica circuit,” IEEE International Symposium on Circuits and Systems (ISCAS 2010), Paris, France, 2010, pp. 4297-4300.

N. Chang, R. Rashidzadeh and M. Ahmadi, “Differential access points for indoor location estimation,” IEEE Int. Conf. Electro/Information Technology, Jun. 7-9, 2009, pp. 256-259.

R. Rashidzadeh, M. Ahmadi, “Short time interval measurement using a time amplifier,” IEEE Canadian Conference on Electrical and Computer Engineering, Niagara Falls, May 2008, pp. 1884 – 1896.

R. Rashidzadeh, W. C. Miller, M. Ahmadi, “A PLL based analog tester core,” IEEE Canadian Conference on Electrical and Computer Engineering, Saskatoon, 2005, pp. 824-827.

S. Alirezaee, M. Ahmadi, H. Aghaeinia, R. Rashidzadeh, “A weighted pseduo-zernike feature for face recognition,” IEEE Canadian Conference on Electrical and Computer Engineering, Saskatoon, May 2005, pp. 1914 – 1917.

S. Alirezaee, H. Aghaeinia, K. Faez, R. Rashidzadeh, “An efficient preprocessing block for the middle-age Persian manuscripts,” IEEE Canadian Conference on Electrical and Computer Engineering, Saskatoon, May 2005, pp. 1914 – 1917

R. Rashidzadeh, M. Ahmadi, W. C. Miller, “An IP tester core for SoC RF circuits,” Proceedings of Micronet R & D Annual Workshop, Ottawa, 2005, pp. 69-70.

R. Rashidzadeh, M. Ahmadi, W. C. Miller, “An embedded tester core for system-on-chip,” Proceedings of 4th IEEE International Workshop on System-on-Chip for Real-Time Applications, Banff, Canada, 2004, pp. 105-108.

R. Rashidzadeh, M. Ahmadi, W. C. Miller, G.A. Jullien, (2003) "A Tester-on-Chip and A MEMS Interface," Proceedings of Micronet R & D Annual Workshop, Toronto, Canada, 2003, pp. 100-101.

R. Rashidzadeh, M. Ahmadi, W.C. Miller, "A Tester-on-Chip Implementation in 0.18um CMOS Utilizing A MEMS Interface,” IEEE International Symposium on Circuits and Systems, Bangkok, Thailand, 2003, vol. 5, pp. V561-V564.