Centre for Advanced Microscopy and Materials Characterization

Environmental Scanning Electron Microscopy

The facility has an FEI Quanta 200 Environmental Scanning Electron Microscope (ESEM) with an EDAX Octane Plus SDD detector and TEAM software.  The ESEM can operate in Low Vacuum for non-conductive samples, eliminating the need for conductive coating.  The ESEM has a resolution of 3 nanometers in High Vacuum, and can accommodate wet, dirty, non-conductive and outgassing samples.  The EDAX EDS TEAM software has the capability of a wide variety of materials characterization modes including simple point analysis, linescans and element mapping (including multifield maps and phase analysis). The facility has a carbon coater for when conductive coating is necessary.

Booking information and pricing

The WiTec Alpha 300  Atomic Force Microscope (AFM) and Confocal Raman Spectrometer is a multifunctional integrated system which allows users to do both AFM and Raman spectroscopy on the same sample, on the same instrument, using integrated software. It also has a True Surface Profilometer, and SNOM (Scanning Near Optical Microscopy) capabilities which can achieve an optical resolution of 50-100 nm. The WiTec System has a 532 nm and 785 nm laser, and is equipped with both transmitted and reflected light sources for a variety of samples. It is also capable of carrying out analyses in liquid, and has water-immersion objective lenses.

Booking Information and User Fees for the AFM/Raman