The Centre for Advanced Microscopy and Materials Characterization is a multi-user facility with State of the Art equipment to meet a variety of microscopy and analytical needs.
Environmental Scanning Electron Microscopy
The facilty has an FEI Quanta 200 Environmental Scanning Electron Microscope (ESEM) with an EDAX Octane Plus SDD detector and TEAM software. The ESEM can operate in Low Vacuum for non-conductive samples, eliminating the need for conductive coating. The ESEM has a resolution of 3 nanometers in High Vacuum, and can accommodate wet, dirty, non-conductive and outgassing samples. The EDAX EDS TEAM software has the capability of a wide variety of materials characterization modes including simple point analysis, linescans and element mappping (including multifield maps and phase analysis). The facility has a carbon coater for when conductive coating is necessary.
The WiTec Alpha 300 Atomic Force Microscope (AFM) and Confocal Raman Spectrometer is a multifunctional integrated system which allows users to do both AFM and Raman spectroscopy on the same sample, on the same instrument, using integrated software. It also has a True Surface Profilometer, and SNOM (Scanning Near Optical Micrsocopy) capabilities which can achieve an optical resolution of 50-100 nm. The WiTec System has a 532 nm and 785 nm laser, and is equipped with both transmitted and reflected light sources for a variety of samples. It is also capable of carrying out analyses in liquid, and has water-immersion objective lenses.
Room 107, 109 Great Lakes Institute for Environmental Research,
University of Windsor,
2990 Riverside Dr. West
Technician: Sharon Lackie, Room 213
Phone: (519) 253-3000
Ext. 4850 (office),
Ext. 4932 (SEM Lab)
Ext. 4986 (Raman/AFM Lab)
Fax: (519) 971-3616
Faculty Supervisor: Christopher Weisener,
Phone:519 253-3000 ext. 3753
Hours of Operation: 8:30 am - 4:30 pm